報告題目：Modern surface metrology and application in advanced manufacturing
報告人：Dr Wenjuan Sun(National Physical Laboratory, United Kingdom)
講座時間：2017-12-23上午9:30-11:00
講座地點：正禾賓館東3會議室
邀請人：楊廣珺、姚磊江
承辦學院：無人機重點實驗室
聯系人：張勇禎
聯系電話：17749125677
報告簡介：
Surface metrology is widely used in many industries including automotive and aerospace. The significant growth of advanced manufacturing, requires measurements of surfaces with complex external and internal structures, where conventional 2D profile measurements and destructive measurements cannot meet the needs. The talk will discuss challenges faced in advanced manufacturing and will introduce the latest development of surface metrology at the National Physical Laboratory (NPL), UK. Several case studies will be given. The talk will also introduce the current state-of-the-art traceable measurement framework at NPL and the latest development of international standards in the field of surface metrology.
報告人簡介：
Dr Wenjuan Sun is EPSRC tomography roadmap, working group member, Dimensional X-ray Computed Tomography(XCT) Conference Conference Chair, Co-chair , UK user group coordinator, International Organization for Standardization, British Standards Institute committee ISO/TC 213 WG10, WG16 Committee member, National Physical Laboratory, UK X-ray computed tomography Project formulation, project management PhD student supervisor, national and international secondments. Main area of interests: X-ray Computed tomography, Optical CMM, Additive Manufacturing.
